Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 65,
  • Issue 1,
  • pp. 105-107
  • (2011)

Infrared Monitoring of Diamond Metalization

Not Accessible

Your library or personal account may give you access

Abstract

The ultra-high-vacuum growth of thin chromium and aluminum films on single diamond crystals at various temperatures was monitored by means of infrared spectroscopy, which provides instant information on electronic and morphological properties of the produced metal films. In accordance with atomic force microscopy results, spectra for Al indicate a clear island-like growth in the beginning followed by a transition to a continuous layer. Cr growth results in much smoother films because of a special growth mechanism. Analysis of infrared spectra of both kinds of ultrathin metal layers yields a high DC conductivity well above 10<sup>6</sup> S/m starting from only a few nanometers thickness for sufficiently high substrate temperatures.

PDF Article

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2022 | Optica Publishing Group. All Rights Reserved