Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Applied Spectroscopy
  • Vol. 69,
  • Issue 10,
  • pp. 1144-1151
  • (2015)

Compact Handheld Probe for Shifted Excitation Raman Difference Spectroscopy with Implemented Dual-Wavelength Diode Laser at 785 Nanometers

Not Accessible

Your library or personal account may give you access

Abstract

A compact handheld probe for shifted-excitation Raman difference spectroscopy (SERDS) with an implemented dual-wavelength diode laser with an emission at 785 nm is presented. The probe is milled from aluminum and has dimensions 100 × 28 × 12 mm. The diode laser provides two excitation lines with a spectral distance of 10 cm−1 (0.62 nm), has a spectral width smaller than 11 pm, and reaches an optical power of 120 mW ex probe. Raman experiments were carried out using polystyrene (PS) as the test sample. During a measurement time of over 1 h, a stable spectral center position of the Raman line at 999 cm−1 of PS was achieved within a spectral window of 0.1 cm−1. Here, the Raman intensity of this line was observed with a peak-to-peak variation smaller than ±2%, dominated by shot noise interference. A deviation of the center position of a Raman line with <±1 cm−1 was observed over the whole excitation power range. Raman investigations of the quartz glass window of the SERDS probe showed minor interference. The results demonstrate the suitability of the developed handheld probe for Raman investigations and the application of in situ SERDS experiments to fields such as food safety control, medical diagnostics, and process control.

PDF Article
More Like This
Capability of shifted excitation Raman difference spectroscopy under ambient daylight

Martin Maiwald, André Müller, Bernd Sumpf, Götz Erbert, and Günther Tränkle
Appl. Opt. 54(17) 5520-5524 (2015)

Dual-wavelength diode laser with electrically adjustable wavelength distance at 785  nm

Bernd Sumpf, Julia Kabitzke, Jörg Fricke, Peter Ressel, André Müller, Martin Maiwald, and Günther Tränkle
Opt. Lett. 41(16) 3694-3697 (2016)

Microsystem 671 nm light source for shifted excitation Raman difference spectroscopy

Martin Maiwald, Heinar Schmidt, Bernd Sumpf, Götz Erbert, Heinz-Detlef Kronfeldt, and Günther Tränkle
Appl. Opt. 48(15) 2789-2792 (2009)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved