Abstract

Solder masks are essential materials used in the manufacture of printed circuit boards (PCB). This material protects PCBs against several types of damage and performance failure. In this study, the capabilities of laser-induced breakdown spectroscopy (LIBS) were investigated for the direct analysis of solder masks typically commercialized for homemade PCB production, and inductively coupled plasma–optical emission spectrometry (ICP-OES) was used to obtain a chemical profile for the target analytes Al, As, Ba, Cd, Co, Cr, Cu, Fe, Hg, Mg, Mn, Ni, Pb, Sb, Sn, and Zn. Inductively coupled plasma–mass spectrometry (ICP-MS) was also employed for the determination of potentially toxic elements, such as As, Cd, Cr, Pb, and Hg. In addition to the qualitative information that may be useful for obtaining the spectral profile related to the raw materials present in solder masks formulations, LIBS was also applied for major elements (Al, Ba, Cu, Fe, Mg, and Zn) determination, but due to the low sensitivity, the obtained results were only semi-quantitative for Ba. Regarding Cd, Cr, Hg, and Pb, the samples analyzed were following the restriction of hazardous substances (RoHS) directive of the European Union.

© 2018 The Author(s)

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