About Chinese Optics Letters
Chinese Optics Letters (COL) is an international journal aimed at the rapid dissemination of latest, important discoveries and inventions in all branches of optical science and technology. It is considered to be one of the most important journals in optics in China. It is collected by Optica Publishing Group and also indexed by Science Citation Index (SCI), Engineering Index (EI), etc.
COL is distinguished by its short review period (~30 days) and publication period (~100 days).
With its debut in January 2003, COL is published monthly by Chinese Laser Press, and distributed by Optica Publishing Group outside of Chinese Mainland.
Sponsor
The journal is sponsored by Shanghai Institute of Optics and Fine Mechanics (SIOM), Chinese Academy of Sciences and the Chinese Optical Society (COS). Their information can be found on the websites: www.siom.ac.cn and www.cncos.org, respectively.
Key Journal Metrics
Impact Factor: 3.5*
Journal Citation Indicator: 0.87*
Google Scholar h5-index: 30†
*Source: 2023 Journal Citation Reports® (Clarivate, 2023).
†2023 Google Scholar Optics & Photonics Top Publications.
Editorial Board
Editor-in-Chief
Zhizhan Xu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Executive Editors-in-Chief
Feng Chen, Shandong University, China
Saulius Juodkazis, Swinburne University of Technology, Australia
Yanqing Lu, Nanjing University, China
Deputy Editors
Yuxin Leng, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Shilong Pan, Nanjing University of Aeronautics and Astronautics, China
Jian Wang, Huazhong University of Science and Technology, China
Shumin Xiao, Harbin Institute of Technology (Shenzhen), China
Shifeng Zhou, South China University of Technology, China
Topical Editors
Vijayakumar Anand, Tartu University, Estonia
Fang Bo, Nankai University, China
Yuping Chen, Shanghai Jiao Tong University, China
Rafael Espinosa-Luna, CIO, Mexico
Xinyu Fan, Shanghai Jiao Tong University, China
Shaobo Fang, Institute of Physics, Chinese Academy of Sciences, China
Tian Jiang, National University of Defense Technology, China
Aleksandr Kuchmizhak, Far Eastern Federal University, Vladivostok, Russia
Tao Li, Nanjing University, China
Jiao Lin, University of Melbourne, Australia
Zhaojun Liu, Shandong University, China
Xiaosong Ma, Nanjing University, China
Yufei Ma, Harbin Institute of Technology, China
Dong Mao, Northwestern Polytechnical University, China
Gero A. Nootz, University of Southern Mississippi, USA
Jean-Michel Nunzi, Queen's University, Canada
Pascal Picart, Université du Maine, France
Fabian Rotermund, Korea Advanced Institute of Science and Technology, Korea
Airán Ródenas Seguí, Universidad de La Laguna (ULL), Spain
Hua Shen, Nanjing University of Science and Technology, China
Yasuhiko Shimotsuma, Kyoto University, Japan
Zhen Tian, Tianjin University, China
Maria Antonietta Vincenti, University of Brescia, Italy
Taco Visser, University of Rochester, USA
Jun Wang, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, China
Lei Wang, Jilin University, China
Jian Wu, East China Normal University, China
Feihu Xu, Chinese University of Science and Technology, China
Jing Xu, Zhejiang University, China
Xin Yuan, Nokia Bell Labs, USA
Qiwen Zhan, Shanghai University of Technology, China
Ge Zhang, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, China
Hongbo Zhang, Middle Tennessee State University, USA
Early Career Editorial Board
Wenhan Cao, Shanghai University of Science and Technology, China
Peng Chen, Nanjing University, China
Tao Chen, Shanghai Institute of Technical Physics, CAS, China
Zhenzhou Cheng, Tianjin University, China
Jinming Cui, China University of Science and Technology, China
Guangwei Deng, University of Electronic Science and Technology of China, China
Fei Ding, University of South Denmark, Denmark
Ran Ding, Jilin University, China
Qingyang Du, Zhejiang Laboratory, China
Xin Guo, Zhejiang University, China
Xueshi Guo, Tianjin University, China
Jijun He, Nanjing University of Aeronautics and Astronautics, China
Sicong He, Southern University of Science and Technology, China
Chong Hou, Huazhong University of Science and Technology, China
Yidong Hou, Sichuan University, China
Shanting Hu, Beijing Institute of Technology, China
Qiushi Huang, Tongji University, China
Biqiang Jiang, Northwestern Polytechnical University, China
Hua Li, Shanghai Institute of Microsystem and Information Technology, CAS, China
Huan Li, Zhejiang University, China
Jin Li, Beihang University, China
Fucai Liu, University of Electronic Science and Technology of China, China
Wenjun Liu, Beijing University of Posts and Telecommunications, China
Xianwen Liu, Beijing Institute of Technology, China
Cuicui Lu, Beijing Institute of Technology, China
Junpeng Lyu, Southeast University, China
Jun Ma, Nanjing University of Science and Technology, China
Hongcheng Ni, East China Normal University, China
Junsong Peng, East China Normal University, China
Qifeng Ruan, Harbin Institute of Technology (Shenzhen), China
Zhenzhou Tang, Nanjing University of Aeronautics and Astronautics, China
Fan Wang, Beihang University, China
Junjia Wang, Southeast University, China
Peng Wang, Shanghai Institute of Technical Physics, CAS, China
Shuang Wang, China University of Science and Technology, China
Yanlong Wang, Dalian Institute of Chemical Physics, CAS, China
Dandan Wen, Northwestern Polytechnical University, China
Yipeng Wu, University of California, Los Angeles, USA
Ke Xu, Harbin Institute of Technology (Shenzhen), China
Jiong Yang, Soochow University, China
Yihao Yang, Zhejiang University, China
Hualei Yin, Nanjing University, China
Shaoliang Yu, Zhejiang Laboratory, China
Zejie Yu, Zhejiang University, China
Yongquan Zeng, Wuhan University, China
Junwen Zhang, Fudan University, China
Keye Zhang, East China Normal University, China
Long Zhang, Xiamen University, China
Meng Zhang, Beihang University, China
Yupeng Zhang, Shenzhen University, China
Shiyang Zhong, Institute of Physics, CAS, China
Yu Zhou, Harbin Institute of Technology (Shenzhen), China
Manuscript Office
Shanghai Institute of Optics and Fine Mechanics,
Chinese Academy of Sciences,
390 Qinghe Rd., Jiading,
P. O. Box 800-211,
201800, Shanghai, China
E-mail: col@siom.ac.cn
Tel: 0086-21-69918428
Fax: 0086-21-69918705
