Abstract
We report a novel design of amorphous silicon gate (ASG) driver
circuit with not only low output noises but also improved reliability. The ASG circuits are
made of thin-film transistors (TFTs) and integrated in the substrate
glass. Unlike the most traditional ASG circuits, the proposed pull-down
signals are complementary with lower frequency to discharge the critical
nodes in the proposed circuit. The new pull-down signals are created
to discharge each two adjacent stage circuits. By inputting two controlled
pulse signals, the prospective pull-down signals can be created eventually
in the circuit. To simulate the real driving conditions, a string
of a resistance (1.24
${{k}}\Omega$
) and a capacitance (85.5 pF) are
connected to each output as loading. By probing the output pads of
the real circuit sample, the output characteristics can practicably
be measured. In particular, the output ripples can be suppressed to
0.28 V. Moreover, the measured threshold voltage
$({\rm V}_{\rm th})$
shift with two stressing signals at different frequencies
reveals the significant difference. The measured
${\rm V}_{\rm th}$
shift after 12 h of the clock stressing with lower frequency
(167 Hz) is about 12% slower speed than that of the stressing clock
with higher frequency (16.7 kHz) under the high temperature (60
$^{\circ}{C}$
).
© 2014 IEEE
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