Abstract
With attempt to suppress the Moiré phenomenon, we conduct
ray tracing simulations with various metal grids having different
degree of randomness (e.g., rectangular, width-altered rectangular,
line-shifted rectangular, wavy square, and random metal grids) in
the presence of twisted nematic (TN) or in-plane switching (IPS) mode
black matrix (BM). We analyze their angular dependence in terms of
the standard deviation (SD) calculated from the simulated ray distribution.
It is observed that metal grids with a lower degree of randomness
exhibit a stronger angular dependence, yet lower SD value over the
broader range of crossing angles. Though metal grids with a higher
degree of randomness show a weaker angular dependence, yet they bring
in higher fluctuation in the SD value due most likely to point defects.
The wavy square metal grid results in periodic point defects, whereas
the random metal grid gives rise to aperiodic point defects. Through
a comparison between simulation and experiment results, we have found
that moiré patterns are hardly seen to the naked eye when the
SD value is less than 10, which provides useful design guidelines
of metal grids.
© 2016 IEEE
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