Abstract
In this paper, the electrical properties of oxide cathode and oxide
cathode plus, supplied by LG Philips Displays, have been investigated in relation
to different cathode activation regimes and methods. Oxide cathode activation
treatment for different durations has been investigated. The formations of
the compounds associated to the diffusion of reducing elements (Mg, Al, and
W) to the Ni cap surface of oxide cathode were studied by a new suggestion
method. Scanning electron microscopy (SEM) coupled with energy dispersive
X-ray spectroscopy (EDX) was used as analytical techniques.Al, W, and Mg doping elements take place during heating to 1080 K (Ni-Brightness)
under a rich controlled Ba-SrO atmosphere through an acceleration life
test. The chemical transport of these elements was occurred mainly by the
Ni cap grain boundary mechanism with significant pile-up of Mg compounds.
Al and W show a superficial concentrations and distribution.A new structural and resistivity network model of oxide cathode plus
are suggested. The new structural model shows a number of metallic and metallic
oxide pathways are exist at the interface or extended through the oxide coating.
The effective values of the resistances and the type of the equivalent circuit
in the resistivity network model are temperature and activation time dependent.
© 2006 IEEE
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