Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Journal of Lightwave Technology
  • Vol. 22,
  • Issue 12,
  • pp. 2763-
  • (2004)

AWG Model Validation Through Measurement of Fabricated Devices

Not Accessible

Your library or personal account may give you access

Abstract

In this paper, the validation of a previously published arrayed-waveguide grating (AWG) model is presented, using measures of fabricated devices. The measured spectrum, dispersion, and loss, along with Fourier spectroscopy (FS) measurements of the array errors, are used to verify the numerical simulations and analytical derivations for a Gaussian AWG device. The verified model is then used to investigate the relationship between the different fabrication errors and their impact on the response of flat-top AWG devices. Several conclusions are presented about the accuracy on the use of FS measurements in this modeling,since some discrepancies between the FS measurements and simulations are found and discussed and their motivations identified. Moreover, the ability and flexibility of this model to distinguish and clarify the source of each degradation in the performance of flat-top AWGs is proven.

© 2004 IEEE

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2022 | Optica Publishing Group. All Rights Reserved