Abstract
We describe a powerful method for precisely measuring polarization
crosstalk dependence on length for birefringent waveguides which uses
optical low coherence interference between excited and orthogonally
coupled light waves. This method is applied to 10-m long silica-based
waveguides with the total polarization crosstalks of 8.9\;\times\;10-3 and
7.5\;\times\;10-3. The spatial resolution is 10 cm and the measurement
error for a waveguide part longer than 1 m is { <= }10%. A comparison
of measured and theoretical crosstalk curves for the waveguides enables us
to confirm that the bends in the waveguides are the main origin of the
crosstalk. The polarization crosstalk per bent section is
{\sim}4\;\times\;10-5.
© 1998 IEEE
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