Abstract
Operation performance of a 40 Gbps, 2-bit Optical Digital-to-Analog
converter (ODAC) and its application to optical label switching systems have
been investigated. The device is composed of a 1$\,\times\,$2 multi-mode interference (MMI) splitter, one-bit-delay line, and
a 2$\,\times\,$1 MMI combiner. It has a high-mesa structure fabricated on
InP-based materials. Dependence of output signal level on input signal
wavelength and device temperature was measured. Due to the optical phase
variation caused by the refractive index change with wavelength and
temperature, output signal level varied, and it agreed well with simulation
results. Four-level signals were generated and a quarter dependence of phase
on temperature and wavelength compared with that for 10-Gbit/s was verified.
Next, operation tolerance of the ODAC as an optical label processor, bit
error rate (BER) of the digital-to-analog (DA)-converted signal was
simulated. The tolerance against fluctuation of light source power, optical
phase in the device, optical chirp, and extinction ratio of input signal was
estimated. For all parameters, operation tolerance could be kept, but that
for 40 Gbps is smaller than that for 10 Gbps. Then, autonomous label
processing and optical label switching performance using a gate pulse
generation scheme based on phase-shifted preamble was investigated. Optical
DA conversion and three kinds of optical label were recognized at a bit rate
of 40 Gbps, and optical packet transfer could be confirmed.
© 2010 IEEE
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