Abstract

A new interferometric method for measuring the thickness of infra-red liquid absorption cells is described. An accuracy of 0.2 microns is obtained independently of the thickness. The advantages over methods previously described are that the cell plates need not be parallel and the wedge angle between them is determined along with the thickness. The thickness measured is not an average value. It is possible to map out the profile of the cell. The method may be used even when the cell plates are very irregular.

© 1950 Optical Society of America

Infra-Red Absorption Cells and Measurement of Cell Thickness

Don C. Smith and Elmer C. Miller
J. Opt. Soc. Am. 34(3) 130-134 (1944)

A Variable Thickness Low Temperature Infra-Red CeH*,†

Robert B. Holden, William J. Taylor, and Herrick L. Johnston
J. Opt. Soc. Am. 40(11) 757-760 (1950)

Infra-Red Microspectroscopy*

Elkan R. Blout, George R. Bird, and David S. Grey
J. Opt. Soc. Am. 40(5) 304-313 (1950)

Recent Investigations in the Far Infra-Red

T. King McCubbin and William M. Sinton
J. Opt. Soc. Am. 40(8) 537-539 (1950)

Construction of a Double Beam Recording Infra-Red Spectrophotometer

John U. White and Max D. Liston
J. Opt. Soc. Am. 40(1) 29-35 (1950)