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A Reflectometer for Measuring Diffuse Reflectance in the Visible and Infrared Regions

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Abstract

A simple reflectometer to measure diffuse spectral reflectance in the visible and infrared spectral regions is described. The reflectometer is employed in conjunction with the monochromator of a Perkin-Elmer Model 12B spectrometer. A lead sulfide photoconductive cell with a simple bridge circuit is employed as the detector. The long wavelength cutoff is at 2.8 microns while the short wavelength limit is defined by the spectral emittance of the tungsten lamp used as the source of radiation. The spectral reflectance of several common materials, including human skin, have been determined.

© 1952 Optical Society of America

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