Abstract

Details are given of an instrument capable of measuring large and small optical phase differences between the components of an elliptically polarized radiation. The lowest limit is between 10⁻⁴ and 10⁻⁵ 2π. The compensator consists of an accurate quarter-wave plate (Sénarmont compensator) for the wavelength used (5461A) and a Nakamura half-shadow device. The quarter-wave plate, suitably orientated, reduces the elliptically polarized light to a linearly polarized vibration, the azimuth of which is simply related to the phase difference. The azimuth is determined with a Glan-Thompson polarizing prism. The full theory is given with special reference to possible sources of error. These are calculated for a series of values. An expression for the half-shadow sensitivity is found. The method of use and of construction are fully described. The instrument is particularly suitable for the measurement of streaming double refraction.

© 1954 Optical Society of America

Optical Compensators for Measurement of Elliptical Polarization

H. G. Jerrard
J. Opt. Soc. Am. 38(1) 35-59 (1948)

Analysis of Elliptical Polarization

M. Richartz and Hsien-Yü Hsü
J. Opt. Soc. Am. 39(2) 136-157 (1949)

Determination of Extinction Directions in a Doubly-Refracting Medium of Small Phase Difference: Application to Flow Birefringence Studies

H. G. Jerrard
J. Opt. Soc. Am. 46(4) 259-262 (1956)

A New Photoelectric Method for the Calibration of Retardation Plates

D. D. Randall
J. Opt. Soc. Am. 44(8) 600-602 (1954)

Transmission of Light through Birefringent and Optically Active Media: the Poincaré Sphere

H. G. Jerrard
J. Opt. Soc. Am. 44(8) 634-640 (1954)