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Simplified Treatment of Ellipsometry

Joseph A. Faucher, George M. McManus, and Hans J. Trurnit

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Abstract

A straightforward treatment of the properties of elliptically polarized light reflected from thin films has been made using only the laws of elementary optics. The results are shown to be in satisfactory agreement with experiment for films of thickness up to 1600 A, far beyond the region of validity of the Drude approximation for very thin films.

© 1958 Optical Society of America

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