Abstract

An interferometric method of coincidence for the measurement of a large step height Δt is reported. The method is based upon the more rigorous interference equation n=2tν+f. The term f is a function of ν and is necessary to account for phase changes upon reflection at the boundaries of the interference film when other than zero or π.

© 1958 Optical Society of America

Phase Shift Effects in Fringes of Equal Chromatic Order*

Charles J. Koester
J. Opt. Soc. Am. 48(4) 255-260 (1958)

Multiple-Beam Fringes of Equal Chromatic Order. Part III. The Cleavage of Topaz

W. F. Koehler and A. Eberstein
J. Opt. Soc. Am. 43(9) 747-749 (1953)

Multiple-Beam Fringes of Equal Chromatic Order. Part IV. Use of Multilayer Films

W. F. Koehler
J. Opt. Soc. Am. 45(11) 934-939 (1955)

Multiple-Beam Fringes of Equal Chromatic Order.* Part I. Phase Change Considerations

W. F. Koehler
J. Opt. Soc. Am. 43(9) 738-743 (1953)

Multiple-Beam Fringes of Equal Chromatic Order. Part VI. Method of Measuring Roughness*

W. F. Koehler and W. C. White
J. Opt. Soc. Am. 45(12) 1011-1014 (1955)