Abstract

A relaxation method is used to adjust the thicknesses of the films of a multilayer in order to alter its transmission characteristics in a limited spectral region. This method is used to modify the spectral transmission of a short-wavelength pass multilayer and a broad-band dielectric mirror. The computations also furnish information useful in controlling the thicknesses of the layers in the fabrication of a multilayer.

© 1958 Optical Society of America

Design of Multilayer Filters by Considering Two Effective Interfaces

S. D. Smith
J. Opt. Soc. Am. 48(1) 43-50 (1958)

Measurement of the Optical Constants of Thin Dielectric Films by Means of Frustrated Total Reflection*

B. P. Sanford
J. Opt. Soc. Am. 48(7) 482-486 (1958)

Optical Properties and Structure of Cerium Dioxide Films

G. Hass, J. B. Ramsey, and R. Thun
J. Opt. Soc. Am. 48(5) 324-327 (1958)

Optical Constants of Evaporated Selenium Films by Successive Approximations

W. F. Koehler, F. K. Odencrantz, and W. C. White
J. Opt. Soc. Am. 49(2) 109-115 (1959)

Methods of Altering the Characteristics of a Multilayer Stack*†

Philip W. Baumeister
J. Opt. Soc. Am. 52(10) 1149-1152 (1962)