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Fringe Sharpening in Divided Beam Interferometers

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Abstract

The development of sharpened fringes in long path length interferometers (like the Twyman-Green, Mach-Zehnder, and series) by intensity and by multiple reflection is described. The cause of the extreme localization of some of the multiple-reflection fringe patterns is discussed.

© 1958 Optical Society of America

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