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Double-Passed Fizeau Interferometer. II. Fringe Systems Formed by the Reflected Beams

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Abstract

The theoretical intensity distribution in the fringes formed when the reflected beams from a Fizeau interferometer are reflected back through the instrument is obtained. It is shown that, under certain conditions, the intensity distribution in these fringes exhibits a periodic modulation as the separation of the plates is changed, so that they can also be used for very accurate measurements.

© 1961 Optical Society of America

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