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Investigation of a Latent-Image Model: Recombination of Trapped Electrons and Free Holes

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Abstract

A modification of a previously described model of photographic latent-image formation (see preceding paper) is in closer agreement with the absolute sensitivity of actual emulsion systems. The modification includes, in addition to recombination of a free electron with a trapped hole, the complementary process: namely, the recombination of a free hole with a trapped electron. When the cross sections for trapping of an electron, for trapping of a hole, and for recombination by either process are all equal, the number of adjustable parameters of the model reduces to only three. These parameters may be assigned reasonable values such that the response of the model closely approximates that of an experimental emulsion system. Effects of changes in various physical properties of the model system are predictable.

© 1965 Optical Society of America

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