Joel A. Gwinn, John F. Kielkopf, and Paul M. Griffin, "Fresnel Diffraction of Light by Slits in Semitransparent Films," J. Opt. Soc. Am. 56, 1338-1344 (1966)
Fresnel diffraction patterns produced by slits in semitransparent metal and dielectric films show a fringed structure which depends upon the index of refraction and the thickness of the film. Intensity distributions calculated on the basis of scalar diffraction theory compare well with the experimental results.
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Handbook of Chemistry and Physics (Chemical Rubber Publishing Company, Cleveland, Ohio, 1962–63), 44th ed., p. 3077.
J. F. Hall and W. F. C. Ferguson, J. Opt. Soc. Am. 45, 74 (1955).
J. F. Hall, J. Opt. Soc. Am. 46, 1013 (1956).
L. G. Schulz, J. Opt. Soc. Am. 44, 357, 362 (1954).
R. H. Huebner, E. T. Arakawa, R. A. Macrae, and R. N. Hamm, J. Opt. Soc. Am. 54, 1434 (1964).
Table II
Measured film thicknesses.
Slit width and material
Thickness mμ
110-μ semitransparent silver
79.5
110-μ zinc sulfide
227
110-μ opaque silver
162
66-μ semitransparent silver
85.4
66-μ zinc sulfide
88.4
Table III
Real and imaginary components of the transmittance i.
Handbook of Chemistry and Physics (Chemical Rubber Publishing Company, Cleveland, Ohio, 1962–63), 44th ed., p. 3077.
J. F. Hall and W. F. C. Ferguson, J. Opt. Soc. Am. 45, 74 (1955).
J. F. Hall, J. Opt. Soc. Am. 46, 1013 (1956).
L. G. Schulz, J. Opt. Soc. Am. 44, 357, 362 (1954).
R. H. Huebner, E. T. Arakawa, R. A. Macrae, and R. N. Hamm, J. Opt. Soc. Am. 54, 1434 (1964).
Table II
Measured film thicknesses.
Slit width and material
Thickness mμ
110-μ semitransparent silver
79.5
110-μ zinc sulfide
227
110-μ opaque silver
162
66-μ semitransparent silver
85.4
66-μ zinc sulfide
88.4
Table III
Real and imaginary components of the transmittance i.