Abstract

A method is described for determining the optical constants of a thin film deposited on a nonabsorbing window using a single set of transmittances over an absorption band. The method depends on the fact that the phase shift of the transmitted radiation can be determined from the transmittances by a Kramers–Kronig transform. No assumption of a physical model or band shape is required. Practical implementation of the method is numerically complicated, and the use of a digital computer is essential.

© 1966 Optical Society of America

Investigation of the Kramers–Kronig analysis: revised optical constants of AgCl

R. S. Bauer, W. E. Spicer, and J. J. White
J. Opt. Soc. Am. 64(6) 830-833 (1974)

Kramers–Kronig Dispersion-Analysis Method for Treating Infrared Transmittance Data*

J. D. Neufeld and G. Andermann
J. Opt. Soc. Am. 62(10) 1156-1162 (1972)

Optical constants of lithium deposits as determined from the Kramers-Kronig analysis

Monique Rasigni and Georges Rasigni
J. Opt. Soc. Am. 67(1) 54-59 (1977)

Optical Properties of Evaporated Films of Chromium and Copper

G. Henderson and C. Weaver
J. Opt. Soc. Am. 56(11) 1551-1559 (1966)

PEPSIOS Purely Interferometric High-Resolution Scanning Spectrometer. III. Calculation of Interferometer Characteristics by a Method of Optical Transients*

John O. Stoner
J. Opt. Soc. Am. 56(3) 370-376 (1966)