Abstract

Previous measurements of high-intensity reciprocity failure (HIRF) and electron-microscopic examinations of development centers were extended by using a particular silver bromide dispersion in gelatin. The effects of various amounts of sulfur-sensitization (S) and various times of exposure were examined in detail. High amounts of S produced considerable HIRF which was diminished but not removed by latensification, whereas a low amount produced no HIRF. The distribution of development centers for high-intensity exposure was broader for high S than for low S. These results are interpreted in terms of the size and dispersity of the latent images. Various developer combinations are arranged qualitatively according to the minimum size necessary to induce development.

© 1966 Optical Society of America

Sulfur Sensitization and High-Intensity Reciprocity Failure of Silver Bromide Grains*

H. E. Spencer and R. E. Atwell
J. Opt. Soc. Am. 54(4) 498-505 (1964)

Study of the Mechanism of Sulfur Sensitization by a Development-Center Technique*

H. E. Spencer, L. E. Brady, and J. F. Hamilton
J. Opt. Soc. Am. 54(4) 492-497 (1964)

Low-Intensity Reciprocity Failure of a AgBr Emulsion: Effect of Halogen Acceptors

H. E. Spencer and D. H. Shares
J. Opt. Soc. Am. 57(4) 508-512 (1967)

Distributions of Development Centers in Reduction-Sensitized Silver Bromide Grains

H. E. Spencer, L. E. Brady, and J. F. Hamilton
J. Opt. Soc. Am. 57(8) 1020-1024 (1967)

The Failure of the Photographic Reciprocity Law at Low Intensity*

J. H. Webb and C. H. Evans
J. Opt. Soc. Am. 28(11) 431-436 (1938)