Abstract

The optical constants of bulk materials and thin films have been conveniently determined employing an automatic curve-fitting procedure to obtain a classical oscillator fit to reflectance and/or transmittance data. The method compares favorably in convenience and accuracy with a Kramers–Kronig analysis of bulk reflectivity spectra and is a better technique than the R,T or T,T methods presently used to analyze spectro-photometric data of thin films.

© 1968 Optical Society of America

Determination of the optical constants of a thin film from transmittance measurements of a single film thickness

Kent F. Palmer and Michael Z. Williams
Appl. Opt. 24(12) 1788-1798 (1985)

Problem of ambiguity in the determination of optical constants of thin absorbing films from spectroscopic reflectance and transmittance measurements

K. Lamprecht, W. Papousek, and G. Leising
Appl. Opt. 36(25) 6364-6371 (1997)

Unambiguous determination of optical constants of absorbing films by reflectance and transmittance measurements

Ross C. McPhedran, Lindsay C. Botten, David R. McKenzie, and Roger P. Netterfield
Appl. Opt. 23(8) 1197-1205 (1984)

Determination of optical constants of absorbing crystalline thin films from reflectance and transmittance measurements with oblique incidence

Haiming Wang
J. Opt. Soc. Am. A 11(8) 2331-2337 (1994)

Determination of thickness and optical constants of thin films from photometric and ellipsometric measurements

Eduardo Elizalde, Jean Marc Frigerio, and Josette Rivory
Appl. Opt. 25(24) 4557-4561 (1986)