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Reflection from an Absorbing Multilayer System

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Abstract

The reflection efficiency of an absorbing multilayer system is calculated, as are details of line profiles. The theory presented is valid for a thin layer of heavy atoms (lead) held in place by a webbing of light material (stearate chain). As an approximation, the indices of refraction of both layers are assumed to be of the form

η=1-δ0λ2.07+iβ0λ3.62.

The multilayer is assumed mounted on a completely absorbing substrate.

© 1968 Optical Society of America

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