Abstract

The thickness and the complex refractive index of a moderately thin absorbing film on a transparent substrate of known optical properties can be determined by measuring the values of reflectance of the sample from opposite sides, and the transmittance. The technique and its use in measuring properties of films of RbI in the uv are described. Errors are reduced by averaging the values of thickness obtained at several wavelengths and by iterating the computations.

© 1970 Optical Society of America

Optical Constants of Silver Sulfide Tarnish Films*

J. M. Bennett, J. L. Stanford, and E. J. Ashley
J. Opt. Soc. Am. 60(2) 224-232 (1970)

Ellipsometric Method for the Determination of All the Optical Parameters of the System of an Isotropic Nonabsorbing Film on an Isotropic Absorbing Substrate. Optical Constants of Silicon*

K. Vedam, W. Knausenberger, and F. Lukes
J. Opt. Soc. Am. 59(1) 64-71 (1969)

Improved method for determination of optical constants of organic thin films from reflection and transmission measurements

Aleksandra B. Djurišić, Torsten Fritz, Karl Leo, and E. Herbert Li
Appl. Opt. 39(7) 1174-1182 (2000)

Determination of Optical Constants from Reflectance or Transmittance Measurements on Bulk Crystals or Thin Films

Hans W. Verleur
J. Opt. Soc. Am. 58(10) 1356-1364 (1968)

Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements

Chubing Peng, Rongguang Liang, J. Kevin Erwin, Warren Bletscher, Kenichi Nagata, and Masud Mansuripur
Appl. Opt. 40(28) 5088-5099 (2001)