Abstract

Components of the dielectric function of a biaxial crystal are related in a simple first-order approximation to pseudodielectric functions calculated in the isotropic two-phase model from ellipsometric data. If |ε| ≫ 1 and one of the principal axes is normal to the plane of incidence, the dominant contribution is shown to arise from the projection of the dielectric tensor onto the line of intersection between surface and plane of incidence.

© 1980 Optical Society of America

Inversion of the nonlinear equations of reflection ellipsometry for uniaxial crystals in symmetrical orientations

M. Elshazly-Zaghloul and R. M. A. Azzam
J. Opt. Soc. Am. 70(7) 880-883 (1980)

Pseudodielectric functions of uniaxial materials in certain symmetry directions

G. E. Jellison, Jr. and J. S. Baba
J. Opt. Soc. Am. A 23(2) 468-475 (2006)

Ellipsometry of a biaxial surface

D. J. De Smet
J. Opt. Soc. Am. 65(5) 542-547 (1975)

Angle of polarization and refractive indices of BaTiO₃

L. V. Deshpande, M. B. Joshi, and R. B. Mishra
J. Opt. Soc. Am. 70(9) 1163-1166 (1980)

Biaxial Crystal Optics*

Jin Au Kong
J. Opt. Soc. Am. 61(1) 49-52 (1971)