Abstract

The complex amplitude at a point in a speckle pattern that is due to a weak scatterer is modeled as the superposition of N sinusoidal waves of random phase, with the probability density of these phases given by the nonuniform von Mises rather than by the uniform one that characterizes a strong scatterer. Explicit formulas are obtained for both intensity and total phase statistics in terms of a single parameter directly related to the density function of the constituent phasors. The case in which, in addition, N itself is random (governed by a Poisson distribution with mean value 〈N〉) is also studied.

© 1981 Optical Society of America

Weak-scatterer generalization of the K-density function. II. Probability density of total phase

Richard Barakat
J. Opt. Soc. Am. A 4(7) 1213-1219 (1987)

First-order intensity and phase statistics of Gaussian speckle produced in the diffraction region

Jun Uozumi and Toshimitsu Asakura
Appl. Opt. 20(8) 1454-1466 (1981)

Onefold photoelectron-counting statistics for non-Gaussian light: scattering from an arbitrary number of weak scatterers

Richard Barakat
J. Opt. Soc. Am. 73(9) 1138-1142 (1983)

Uniqueness of phase retrieval from intensity measurements

John T. Foley and R. Russell Butts
J. Opt. Soc. Am. 71(8) 1008-1014 (1981)

Root-mean-square difference between the intensities of non-Gaussian speckle at two different wavelengths

Mitrajyoti Deka, Silverio P. Almeida, and Hitoshi Fujii
J. Opt. Soc. Am. 71(2) 155-163 (1981)