Abstract

The different steps leading to the determination of a surface profile deduced from microdensitometer analysis of electron micrographs of shadowed surface replicas are reviewed. It is shown that monodimensional median filtering is sometimes inadequate to remove the low-frequency noise generated by the Levy–Wiener process. A new treatment is proposed that corrects this disadvantage.

© 1984 Optical Society of America

Influence of some parameters on the surface profile restored from microdensitometer analysis of electron micrographs of surface replicas

F. Varnier, G. Rasigni, J. P. Palmari, A. Llebaria, and M. Rasigni
Appl. Opt. 23(20) 3705-3717 (1984)

Study of surface roughness using a microdensitometer analysis of electron micrographs of surface replicas: I. Surface profiles

Monique Rasigni, Georges Rasigni, Jean-Pierre Palmari, and Antoine Llebaria
J. Opt. Soc. Am. 71(9) 1124-1133 (1981)

Validity of surface-roughness study using microdensitometer analysis of electron micrographs of surface replicas

Monique Rasigni, Françoise Varnier, Georges Rasigni, Jean-Pierre Palmari, and Antoine Llebaria
J. Opt. Soc. Am. 71(12) 1549-1550 (1981)

Study of surface roughness using microdensitometer analysis of electron micrographs of surface replicas. II: Autocovariance functions

Monique Rasigni, Georges Rasigni, Jean-Pierre Palmari, and Antoine Llebaria
J. Opt. Soc. Am. 71(10) 1230-1237 (1981)

Further comparisons between surface scattering theory and measurements

Yaujen Wang and William L. Wolfe
J. Opt. Soc. Am. A 1(7) 783-784 (1984)