Abstract

It is shown that rough surfaces of thin silver films deposited on LiF underlayers may be accurately described by a low-order autoregressive process. The autoregressive (AR) parameters are determined, and the advantages of describing statistically rough surfaces of thin deposits by linear models instead of with the traditional autocovariance function (ACF) or the profile power-spectral-density function (PPSDF) are discussed.

© 1993 Optical Society of America

Statistical parameters for rough surfaces of thin films of CaF₂ and Ag/CaF₂

Francoise Varnier, Nicole Mayani, and Georges Rasigni
Appl. Opt. 28(1) 127-134 (1989)

Statistical parameters for random and pseudorandom rough surfaces

G. Rasigni, M. Rasigni, J. Palmari, C. Dussert, F. Varnier, and A. Llebaria
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Distribution of zero crossings for the profile of random rough surfaces

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