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Approach to dielectric tensor slice-type tomography

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Abstract

An approach to computer-aided tomography of a dielectric tensor field is theoretically investigated. A method is proposed for reconstructing the differences and directions of the secondary principal values of a dielectric tensor in a nonabsorbing inhomogeneous object by measuring scattered light caused by two incident beams shifting stepwise from the surface of the object to its interior. The path is regarded as a series of different linear retarders, and their retardations and orientations are calculated from noisy data by the algorithm of the method. The algorithm is numerically examined by using a known dielectric distribution that exhibits an inhomogeneous rotation of the secondary principal axes. The algorithm is found to be effective. The reconstructed values are compared with those produced by three other slice-type methods. The present method has the smallest accumulated errors, and it alone reconstructs the absolute value of the difference of the values and their directions of any slice within the object from the data on only the two end points of the slice’s thickness.

© 1997 Optical Society of America

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