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Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si–SiO2 interface

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Abstract

An achromatic infrared (λ=1.24 μm), Si-prism quarter-wave retarder (QWR) is described that uses total internal reflection at a buried SiSiO2 interface at an angle of incidence ϕ near 33°, where Δ/ϕ=0. The retardance Δ deviates from 90° by <±2° within a field of view of ±10° (in air) over the entire bandwidth. Because the SiO2 layer at the base of the prism is optically thick, this QWR is unaffected by environmental contamination.

© 2004 Optical Society of America

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