Abstract
An achromatic infrared Si-prism quarter-wave retarder (QWR) is described that uses total internal reflection at a buried interface at an angle of incidence ϕ near 33°, where The retardance Δ deviates from 90° by <±2° within a field of view of ±10° (in air) over the entire bandwidth. Because the layer at the base of the prism is optically thick, this QWR is unaffected by environmental contamination.
© 2004 Optical Society of America
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