Abstract

An eigenvalue-problem approach of blind deconvolution is developed to retrieve the information of two-dimensional subwavelength variation from far-field irradiance with an embedded-aperture configuration with three detectors. A reference signal has been implemented to determine the scaling issue, and hence it allows the exact order of magnitude of the retrieved signals to be estimated correctly. It is shown that the subwavelength variations of a two-dimensional aperture can be identified with a precision of better than a 1% error ratio.

© 2006 Optical Society of America

Identifying the subwavelength-aperture-width variation in the far field with tunable asymmetrically-embedded-aperture interferometer configuration

Shu-Chun Chu and Jyh-Long Chern
J. Opt. Soc. Am. A 22(8) 1600-1606 (2005)

Characterization of the signature of subwavelength variation from far-field irradiance

Shu-Chun Chu and Jyh-Long Chern
Opt. Lett. 29(10) 1045-1047 (2004)

Detection of subwavelength slit-width variation with measurements in the far field by use of an embedded-aperture interferometer configuration

Shu-Chun Chu and Jyh-Long Chern
J. Opt. Soc. Am. A 22(2) 335-341 (2005)

Detection of subwavelength slit-width variation with irradiance measurements in the far field

S. Selci and M. Righini
Opt. Lett. 27(22) 1971-1973 (2002)

Vector diffraction from subwavelength optical disk structures: two-dimensional modeling of near-field profiles, far-field intensities, and detector signals from a dvd

Wei-Chih Liu and Marek W. Kowarz
Appl. Opt. 38(17) 3787-3797 (1999)