Abstract

We present a numerical study of a microscopy setup in which the sample is illuminated with uncontrolled speckle patterns and the two-photon excitation fluorescence is collected on a camera. We show that, using a simple deconvolution algorithm for processing the speckle low-resolution images, this wide-field imaging technique exhibits resolution significantly better than that of two-photon excitation scanning microscopy or one-photon excitation bright-field microscopy.

© 2018 Optical Society of America

Improving the axial and lateral resolution of three-dimensional fluorescence microscopy using random speckle illuminations

Awoke Negash, Simon Labouesse, Nicolas Sandeau, Marc Allain, Hugues Giovannini, Jérôme Idier, Rainer Heintzmann, Patrick C. Chaumet, Kamal Belkebir, and Anne Sentenac
J. Opt. Soc. Am. A 33(6) 1089-1094 (2016)

Super-resolution algorithm based on Richardson–Lucy deconvolution for three-dimensional structured illumination microscopy

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Resolution enhancement in random illumination microscopy using photon correlations

Penghuan Liu
Appl. Opt. 61(10) 2910-2914 (2022)