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Aberration measuring in the random phase field by the Talbot wavefront sensor

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Abstract

The accuracy of measuring optical aberrations in the random phase field by the Talbot wavefront sensor is theoretically investigated. The possibilities of a grating self-imaging phenomenon in the random phase field are investigated based on the simulation results. Random fields of two different types are considered: amplitude and phase Gaussian fields. Simulation results show that the cosine grating is more stable for phase noise in comparison with gratings that have Gaussian and square binary profiles on each cell unit. It is found that phase noise gives increments of high-order aberrations for wavefront reconstruction.

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