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Polarization properties of speckle patterns scattered from rough conductors

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Abstract

The scattered field amplitude and its polarization and statistics are represented as functions of illuminating field, and surface statistics. The random contribution to the field is separated from its deterministic part and expanded into several terms of decreasing orders of magnitude for detailed study. Various terms can be emphasized by proper system design to extract specific information about surface parameters. Preliminary experiments confirm novel predictions related to the correlations of polarized speckle patterns.

© 1987 Optical Society of America

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