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Extreme attenuation of total internal reflection used for determination of optical properties of metals

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Abstract

It is shown that attenuation of total internal reflection, when measured under conditions in which the reflectivity is minimized with respect to the thickness of the intermediate layer for a three-layer structure, might be well suited for determining the dielectric function of metals. Experimental results for several metals in the optical range of the spectrum are presented.

© 1987 Optical Society of America

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