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Flat-sample and limited-field effects in integrating sphere measurements

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Abstract

The effect of large, flat diffuse samples on integrating sphere measurements is calculated exactly, based on an extension of the integral equation formalism of Jacquez and Kuppenheim [ J. Opt. Soc. Am. 45, 460 ( 1955)]. The theory is further extended to include the effect of a limited detector field of view, and examples for different sphere configurations are provided. A variation of Taylor’s method for absolute reflectance measurements is presented that has the advantage of an improved signal-to-noise ratio.

© 1988 Optical Society of America

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