Scattering loss in precision metrology due to mirror roughness

Yehonathan Drori, Johannes Eichholz, Tega Edo, Hiro Yamamoto, Yutaro Enomoto, Gautam Venugopalan, Koji Arai, and Rana X. Adhikari

J. Opt. Soc. Am. A 39(5), 969-978 (2022)  View: HTML | PDF