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Interfacial electronic trap lifetimes studied by the photomodulation of second-harmonic generation processes

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Abstract

Second-harmonic generation and linear photomodulation are combined to study free-charge trapping mechanisms at ZnSe–GaAs(001) heterointerfaces. The variation of second-harmonic intensity as a function of charged-trap density at the buried junction is analyzed quantitatively and used with time-dependent measurements to determine interfacial charge-trap lifetimes.

© 1993 Optical Society of America

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