Abstract
Using freely propagating terahertz radiation, we have measured the complex dielectric constant of optically thick layered materials from 0.2 THz (6.6 cm−1) to 6 THz (200 cm−1). Transmission measurements of a CdTe–adhesive–Si structure have been successfully fitted to a theoretical model over the measurement range. The accuracy of the theoretical fit shows that the technique of time-domain spectroscopy offers advantages over other spectroscopic methods in the extreme far infrared below 200 cm−1. The signal-to-noise capability of our terahertz-spectroscopy technique permits accurate measurement of power transmission coefficients less than 0.001 (absorption coefficients >5000 cm−1) and index variations larger than λ(dn/dλ) > 44, as demonstrated by the accurate fit of our data through the Reststrahlen region of CdTe.
© 1994 Optical Society of America
Full Article | PDF ArticleMore Like This
J. S. Bostak, D. W. van der Weide, D. M. Bloom, B. A. Auld, and E. Özbay
J. Opt. Soc. Am. B 11(12) 2561-2565 (1994)
D. Grischkowsky, Søren Keiding, Martin van Exter, and Ch. Fattinger
J. Opt. Soc. Am. B 7(10) 2006-2015 (1990)
Federico Sanjuan, Alexander Bockelt, and Borja Vidal
Appl. Opt. 53(22) 4910-4913 (2014)