Time-resolved Z-scan measurements of optical nonlinearities

J. Wang; M. Sheik-Bahae; A. A. Said; D. J. Hagan; E. W. Van Stryland

doi:10.1364/JOSAB.11.001009

Journal of the Optical Society of America B
Vol. 11,
Issue 6,
pp. 1009-1017
(1994)
•https://doi.org/10.1364/JOSAB.11.001009

Time-resolved Z-scan measurements of optical nonlinearities

J. Wang, M. Sheik-Bahae, A. A. Said, D. J. Hagan, and E. W. Van Stryland

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J. Wang, M. Sheik-Bahae, A. A. Said, D. J. Hagan, and E. W. Van Stryland, "Time-resolved Z-scan measurements of optical nonlinearities," J. Opt. Soc. Am. B 11, 1009-1017 (1994)

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Abstract

We introduce a temporal delay in one beam of the two-color Z-scan apparatus, which measures nondegenerate nonlinear absorption and nondegenerate nonlinear refraction. This technique allows us to time resolve separately the sign and the magnitude of the nonlinear absorption and refraction at frequency ω_p that are due to the presence of a strong excitation at frequency ω_e. For example, in semiconductors we specifically measure the bound electronic, nondegenerate nonlinear refraction and nondegenerate two-photon absorption, as well as the two-photon-generated free-carrier refraction and absorption as functions of time. We demonstrate this technique on ZnSe, ZnS, and CS₂, using picosecond pulses at 1.06 and 0.532 μm.

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	Material

Parameter	ZnSe	ZnS
β (1.06; 1.06)	0	0
β (0.532; 0.532)	5.8 ± 1 cm/GW	3.4 ± 0.7 cm/GW
β (0.532; 1.06)	15 ± 3 cm/GW	0
β (1.06; 0.532)	4.6 ± 1 cm/GW	0
β^xx (1.06; 0.532)	8.6 ± 2 cm/GW	0
n₂ (1.06; 1.06)	(2.9 ± 0.3) × 10⁻¹⁴ cm²/W	(6.3 ± 1.4) × 10⁻¹⁵ cm²/W
n₂ (0.532; 0.532)	(−6.8 ± 1.4) × 10⁻¹⁴ cm²/W	Not measured
n₂ (0.532; 1.06)	(−5.1 ± 0.5) × 10⁻¹⁵ cm²/W	(1.7 ± 0.4) × 10⁻¹⁴ cm²/W
n₂^xy (0.532; 1.06)	(−2.6 ± 0.3) × 10⁻¹⁴ cm²/W	Not measured
n₂ (1.06; 0.532)	(−9 ± 5) × 10⁻¹⁵ cm²/W	<1.5 × 10⁻¹⁴ cm²/W
γ_a (1.06)	(4.4 ± 1.3) × 10⁻¹⁸ cm²	(7 ± 2) × 10⁻¹⁸ cm²
τ_r (1.06)	(−6.1 ± 1.5) × 10⁻²² cm³	(5.2 ± 1.1) × 10⁻²² cm³
τ	≈1 ns	τ_a ≈ 0.6 ns; τ_r ≈ 0.8 ns

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