Abstract
The evolution of polarization in holographically coupled beams traversing bismuth silicon oxide (BSO) in the configuration is analyzed. The phenomena of electrical birefringence, optical activity, and holographic diffraction are taken into account in a unified and exact manner. The holographic grating is assumed to be static and to be created uniformly in a prior step. Formulas are derived that readily describe quantitatively the amplitudes, azimuth, and ellipticity of the polarization at any depth in the crystal. This analysis extends the research of others [ J. Opt. Soc. Am. B 3, 321 ( 1986); J. Opt. Soc. Am. A 4, 325 ( 1987)]. Relevant literature is reviewed. Simple examples of applications are presented, as well as experimental work relating to parameter quantification.
© 1995 Optical Society of America
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