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Two-color near-field eclipsing Z-scan technique for the determination of nonlinear refraction

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Abstract

We propose a near-field eclipsing Z-scan technique for the measurement of nonlinear refraction of optical materials. The technique does not require sample displacement as in previous Z-scan and eclipsing Z-scan experiments but preserves the high sensitivity of the eclipsing Z-scan method and the experimental simplicity of the Z-scan technique. As an example of the feasibility of the new technique, the dye solution’s thermal nonlinear refraction is measured with increased sensitivity in comparison with the Z-scan method.

© 1997 Optical Society of America

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