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Comparison between Ti anomalous x-ray scattering factors obtained from layered synthetic microstructures and the dispersion relationship

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Abstract

We compare Ti anomalous x-ray scattering factors f′ obtained close to the Ti K absorption edge by two techniques: analysis of changes in Bragg peak reflectivity and resolution for scattering from a Ti/C layered synthetic micro-structure (LSM) and integration through the Kramers–Kronig dispersion relationship of absorption data on pure Ti. The agreement is good for initial results and suggests that the LSM technique should be developed further as a technique for obtaining medium-accuracy x-ray optical constants across large energy ranges.

© 1985 Optical Society of America

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