Abstract

Performing third-harmonic-generation (THG) microscopy with a cylindrically focused Gaussian beam results in significant differences from standard THG microscopy owing to the different phase-matching geometry. These differences are characterized analytically in the slowly varying envelope approximation. It is shown that THG is not observed in samples with normal dispersion even for line illumination. We use this to perform video-rate THG microscopy.

© 2004 Optical Society of America

Second- and third-harmonic generation with vector Gaussian beams

Silvia Carrasco, Bahaa E. A. Saleh, Malvin C. Teich, and John T. Fourkas
J. Opt. Soc. Am. B 23(10) 2134-2141 (2006)

Depth-resolved multiphoton polarization microscopy by third-harmonic generation

Dan Oron, Eran Tal, and Yaron Silberberg
Opt. Lett. 28(23) 2315-2317 (2003)

Third-harmonic generation by use of focused Gaussian beams in an optical superlattice

Guo-Ding Xu, Tie-Wei Ren, Yue-Hua Wang, Yong-Yuan Zhu, Shi-Ning Zhu, and Nai-Ben Ming
J. Opt. Soc. Am. B 20(2) 360-365 (2003)

Third-harmonic generation microscopy with Bessel beams: a numerical study

Nicolas Olivier, Delphine Débarre, Pierre Mahou, and Emmanuel Beaurepaire
Opt. Express 20(22) 24886-24902 (2012)

Vector treatment of second-harmonic generation produced by tightly focused vignetted Gaussian beams

Ara A. Asatryan, Colin J. R. Sheppard, and C. Martijn de Sterke
J. Opt. Soc. Am. B 21(12) 2206-2212 (2004)