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Ultrafast imaging interferometry at femtosecond-laser-excited surfaces

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Abstract

A simple and robust setup for femtosecond time-resolved imaging interferometry of surfaces is described. The apparatus is capable of measuring both very small phase shifts (3×102rad) and amplitude changes (1%) with micrometer spatial resolution (1μm). Interferograms are processed using a 2D-Fourier transform algorithm. We discuss the image formation and the physical interpretation of the measured interferograms. The technique is applied to measure transient changes of a GaAs surface irradiated with intense femtosecond laser pulses with fluences near the ablation threshold.

© 2006 Optical Society of America

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