Abstract

The spiral phase plate etalon transmission function is calculated from the low-reflectivity to high-reflectivity regime. Two approximations are considered: thick-plate approximation and thin-plate approximation. The thick-plate approximation explicitly takes into account the angle between the azimuthally increasing surface and the flat surface, while the thin-plate approximation does not. The two results are in agreement in the low-reflectivity regime, but not in the high-reflectivity regime. The thick-plate approximation is expected to provide a more accurate and general description of the device in all regimes. Origins of the device output intensity dependence on angle due to multiple vortex states present in the device are discussed, and a constraint on the number of internal reflections due to device geometry is also discussed.

© 2014 Optical Society of America

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