Abstract

We investigate the reflected Goos–Hänchen shift of a probe light beam incident from the vacuum upon a metal–insulator–metal microcavity. The cavity is filled with three-level electromagnetically induced transparency atomic gas manipulated by a coherent coupling light field. It is found that the spatial distribution of the coupling field in the cavity structure should be taken into consideration, and as a consequence, the microcavity for the probe light is effectively an optically inhomogeneous cavity. This inhomogeneity can have a huge effect on the lateral shift of the probe light when the order of magnitude of the value of the real or imaginary part of the susceptibility of the probe light is not very small (about ${10}^{-4}$) and can lead to some detailed features that are absent in the homogeneous case.

© 2015 Optical Society of America

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