Abstract
We present a new method to characterize thin-film electro-optic
materials. The method is based on resolving the electric and/or
magnetic field distributions in the near-field region of a split-ring
resonator (SRR) designed for the terahertz (THz) frequency range. We
experimentally validate our simulations by THz near-field imaging of
SRRs directly patterned in contact with a thin-film lithium niobate
crystal as a sensor. Furthermore, we analytically study the effect of
the different applied electric field polarizations and calculate the
sensitivity of the sensor via various polarizations of probe
beams.
© 2019 Optical Society of
America
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