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Laser-pump-resistive-probe technique to study nanosecond-scale relaxation processes

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Abstract

Standard optical pump-probe methods analyze a system’s temporal response to a laser pulse within sub-femtoseconds to several nanoseconds, constrained by the optical delay line’s length. While resistance is a sensitive detector in various fields, its measurements are typically slow (${\gt}\unicode{x00B5}{\rm s}$) due to stabilization requirements. We suggest here a time-resolved pump-probe technique that combines an optical pump pulse and a rectangular electrical probe pulse through the sample, measuring transmission in a 50 ohm matched circuit with a digital oscilloscope. This allows electrically driven delays from nanoseconds to seconds. Demonstrations include studying heat-induced changes in a thin amorphous ${{\rm VO}_x}$ film and carrier relaxation in a CdS photoresistor, showcasing potential applications in heat transfer, biochemical reactions, and gradual electronic transformations.

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Supplementary Material (1)

NameDescription
Supplement 1       Derivations for the resistance formulas (S1-2) and the DC sources voltage drop for the DC setup.

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Data underlying the results presented in this paper are not publicly available at this time but may be obtained from the authors upon reasonable request.

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Equations (2)

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